Description
EQ-TM106-LD is a quartz crystal microbalance (QCM) for in-sit film thickness / deposition rate measurement. It is based on the principle that the mass of a deposited film on a quartz crystal can be measured by monitoring the change in crystal’s oscillating frequency. If the density of deposited material is known, the thickness can be determined to a high resolution of sub-Angstrom (0.037 Å for this equipment).
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| Quartz holder | 6″ BNC-J3 Female to SMA-J3 Female Cable |
SMA Bulkhead Adaptor | Gold quartz crystals |
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| Alloy |
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| Drawing | FlexibilityTest | Application for Sputtering Feedthrough | |
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| No. | Description | Qty |
| 1 | STM-2 rate / thickness monitor | 1 |
| 2 | Software/monitor manual CD |













